Indium Phosphide single crystal
- III-V semiconductor
- Crystal Structure: cubic, zinc blend, a =5.869Å
- Bandgap width : 1.27eV (room), direct gap semiconductor
- Growth method : LEC
- Melting Point :. 1330°C
- B face epi polished, A face etched and lapped
InP(100)±0.5°, Undoped
- Size : 50.8mmØ X 0.4 - 0.5mm thick.
- Conductivity type : N
- Carrier concentration, /cm3 at 77K : < 2 x 1016
- Mobility, cm2/V.s : > 3900
- EPD, /cm2 : < 2 x 104
- Orientation flat : (110)
- Unit price : 25,000 yen
InP(100)±0.5°, S doped
- Size : 50.8mmØ X 0.4 - 0.5mm thick.
- Conductivity type : N
- Carrier concentration, /cm3 at 77K : (1 - 5) X 1018
- Mobility, cm2/V.s : 1500-2000
- EPD, /cm2 : < 2 X 104
- Orientation flat : (110)
- Unit price : 25,000 yen
InP(100)±0.5°, Zn doped
- Size : 50.8mmØ X 0.4 - 0.5mm thick.
- Conductivity type : P
- Carrier concentration, /cm3 at 77K : (1 - 3) X 1018
- Mobility, cm2/V.s : 40 - 60
- EPD, /cm2 : < 2 X 104
- Orientation flat : (110)
- Unit price : 25,000 yen
InP(111)±0.5°, Undoped
- Size : 50.8mmØ X 0.4 - 0.5mm thick.
- Conductivity type : N
- Carrier concentration, /cm3 at 77K : < 1 x 1016
- Mobility, cm2/V.s : 4000
- EPD, /cm2 : ≤ 5 x 104
- Orientation flat : (110)
- Unit price : 25,000 yen
InP(111)±0.5°, S doped
- Size : 50.8mmØ X 0.4 - 0.5mmT
- Conductivity type : N
- Carrier concentration, /cm3 at 77K : (4 - 6) X 1018
- Mobility, cm2/V.s : > 1200
- EPD, /cm2 : < 2 X 104
- Orientation flat : (110)
- Unit price : 25,000 yen
InAs(111)±0.5°, Zn doped
- Size : 50.8mmØ X 0.4 - 0.5mmT
- Conductivity type : P
- Carrier concentration, /cm3 at 77K : 3 X 1018
- Mobility, cm2/V.s : 63
- EPD, /cm2 : < 5 X 104
- Orientation flat : (110)
- Unit price : 25,000 yen
Supplier : Institute of Semiconductors, Chinese Academy of Sciences